ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,067, issued on Sept. 8, was assigned to BDCM A2 LLC (Dover, Del.). "Optically transparent and quasi-transparent reflectarrays for 5g applic... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,068, issued on Sept. 8, was assigned to California Institute of Technology (Pasadena, Calif.). "Distributed time resolved fluorescence sens... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,069, issued on Sept. 8, was assigned to Genesis Intelligence LLC (Jacksonville, Fla.). "Cartridge-based automated rapid test analyzer" was ... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,070, issued on Sept. 8, was assigned to SENSOR COATING SYSTEMS Ltd. (London). "Detection system and method" was invented by Jorg Peter Feis... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,071, issued on Sept. 8, was assigned to MIZAR IMAGING LLC (Woods Hole, Mass.) and THE UNIVERSITY OF NORTH CAROLINA AT CHAPEL HILL (Chapel Hi... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,072, issued on Sept. 8, was assigned to ULTIMA GENOMICS INC. (Fremont, Calif.). "Systems and methods using photonic structure substrates" w... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,073, issued on Sept. 8, was assigned to THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC (Madison, Wis.). "Optical configurations for high resolu... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,074, issued on Sept. 8, was assigned to Tsinghua University (Beijing). "Non-destructive in-situ measurement device and method for high-comp... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,075, issued on Sept. 8, was assigned to UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY (Seoul, South Korea). "Humidity-sensing structura... Read More
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,076, issued on Sept. 8, was assigned to Ninox 360 LLC (Redwood City, Calif.). "Surface inspection system and method" was invented by Peter ... Read More